Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test
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Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test

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1   Scope

This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This test method is considered destructive.