This part of IEC 62396 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects ( [no rendering defined for element: abbrev ] SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the [no rendering defined for element: abbrev ] SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes.

Although developed for the avionics industry, this process may be applied by other industrial sectors.