BS EN 62490-2:2010 ESL measuring method. Surface mount capacitors for use in electronic equipment
BS EN 62490-2 provides the ESL measuring method for surface mount capacitors used in electronic equipment.
The ESL measurement method can be applicable to surface mount capacitors with the following properties, but not limited to these:
a) capacitance range: 10 μF to 1 000 μF;
b) size: L × W = 3,2 mm × 1,6 mm to 7,3 mm × 4,3 mm, H = 4,0 mm;
c) ESL range: 5 nH or less.
The surface mount capacitors in this document are limited to capacitors with lead frame or with thin coated terminals. The scope of this document does not include capacitors with face down terminals.
Contents of BS EN 62490-2:
Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 Test fixture and compensation chip
4.1 Test fixture
4.2 The open, short, and load compensation chip
4.2.1 The open compensation chip
4.2.2 The load compensation chip
4.2.3 The short compensation chip
5 Measuring method
5.1 Measuring equipment
5.2 Measurement conditions
5.3 Measurement points
5.4 Frequency and signal level
5.5 Measurement procedure
5.5.1 General
5.5.2 Open compensation
5.5.3 Load compensation
5.5.4 Short compensation
5.5.5 ESL measurement
6 Items to be indicated in the test result report
Annex A (informative) Theoretical ESL value of the short compensation chip
Figure 1 – Lead frame and thin coating types of surface mount capacitors and the specification of the dimensions (L, W, and H)
Figure 2 – Surface mount capacitors with face down terminal
Figure 3 – Test fixture and terminals of test fixture
Figure 4 – Connection diagram
Figure 5 – Sectional view of the test fixture with an inserted surface mount capacitor pressured to the terminals of the test fixture
Figure 6 – Example of surface mount capacitor mounted on terminals of test fixture
Figure 7 – Front view of mounting position of objects on test fixture
Figure 8 – Measurement points
Figure 9 – Open compensation-chip position
Figure 10 – Load compensation-chip position
Figure 11 – Short compensation-chip position
Figure A.1 – Points of contact of the short compensation chip and terminals of test fixture
Table A.1 – The calculation results of inductance of the short compensation chip